Atomic Force Microscope (AFM) for SEM

Short Description

Atomic Force Microscope for Correlative AFM during SEM measurement able to work both in the SEM chamber and outside the SEM. It also locates quickly the area of interest at the micrometer scale, so that the probe scan speed can be reduced.

Quantum Design AFSEM (AFM_SEM) [0003]

Description of the technique

Scanning Probe Microscope for Correlative AFM during SEM measurement able to work both inside and outside the SEM chamber. The combined SEM/SPM technique allow to quickly locate the area of interest at the micrometer scale and then to promptly scan the region of interest.

Quantum Design AFSEM (AFM_SEM) [0003]

Roberto Senesi; Roberto.senesi@uniroma2.it Laboratory: Microscopy;

TECHNICAL SPECIFICATIONS

  • Possibility to  work both inside and outside the SEM chamber
  • Quickly locates the area of interest at the micrometer scale

Particle accelerator components; CNT composites;

AVAILABLE TECHNIQUES

  • Scanning Probe Microscope (SPM)
  • Atomic Force Microscope (AFM)

Advanced Instrumentation; Biomedical Applications