Short Description 3D printing allows a quick and highly customizable way to produce prototypes and experimental parts using a variety of polymers Description of the technique 3D Printer for common polymers and composite materials, allowing multi-material printing. Allows quick and cheap prototyping of experimental parts as well as preparation of sub-millimeter patterned specimens. Roberto Senesi; Roberto.senesi@uniroma2.it Laboratory: Fabrications TECHNICAL …
Atomic Force Microscope (AFM) for SEM
Short Description Atomic Force Microscope for Correlative AFM during SEM measurement able to work both in the SEM chamber and outside the SEM. It also locates quickly the area of interest at the micrometer scale, so that the probe scan speed can be reduced. Description of the technique Scanning Probe Microscope for Correlative AFM during SEM measurement able to work …
Atomic Force Microscope (AFM) combined to Raman Spectroscopy
Atomic Force Microscope (AFM) combined to Raman Spectroscopy Short Description The technique can be used to characterize surface properties at the atomic level, with resolutions at the nanometer scale, and in combination with the TERS vibrational techniques for molecular sensitivity. Description of the technique The Horiba Xplora Plus Confocal Raman Microscope is coupled to an Scanning Probe Microscope allowing co-localized …
Scanning Electron Microscopy (SEM) with high-precision EDS
Short Description Allows high quality imaging of poor electrical conductors by both secondary and backscattered electrons Designed for extreme versatility of experimental and characterization approaches. Energy dispersive X-ray analysis allowing identification of elemental distribution from sub-micrometre areas of the specimens. Description of the technique The Scanning Electron Microscope (SEM) is a TESCAN VEGA 4 equipped with a GMU chamber and …
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) is a topological analysis technique which belongs to the class of Scanning Probe Microscopy technics. A nanometric tip mounted on a cantilever is made to scroll on the analysed substrate. In order to keep constant the force the cantilever experiences because of the sample, the distance between the sample and the cantilever is varied. We can …