Atomic Force Microscope (AFM) combined to Raman Spectroscopy

Atomic Force Microscope (AFM) combined to Raman Spectroscopy

Short Description The technique can be used to characterize surface properties at the atomic level, with resolutions at the nanometer scale, and in combination with the TERS vibrational techniques for molecular sensitivity.

Description of the technique

The Horiba Xplora Plus Confocal Raman Microscope is coupled to an Scanning Probe Microscope allowing co-localized AFM and Raman analysis and Tip-Enhanced Raman Spectroscopy (TERS) experiments for determination of molecular properties at the nano-scale.

Roberto Senesi; Roberto.senesi@uniroma2.it Laboratory: Microscopy

Horiba Xplora Nano (CONF_AFM_RAMAN) [0002]

TECHNICAL SPECIFICATIONS

  • 3 excitation wavelengths available
  • Confocal microscope with magnification up to 100 x

Skincare products; Stretchable polymers;

AVAILABLE TECHNIQUES

  • Atomic Force Microscopy (AFM)
  • Confocal Raman Microscopy

Life Science; Biomedical Applications;